Hello, everyone.
I’m Zhang from Engineering Department 2.

In my previous blog, I explained the importance of measurement arrangement in the switching evaluation of power semiconductors. This time, I will continue to explain other points to be considered about measurement arrangement.

(Click here for our “Power Module and Power Device” Evaluation Services)

Hello, everyone.
I’m Zhang from Engineering Department 2.

In this article, I will talk about switching evaluation of power semiconductors such as power devices and power modules.

(Click here for our  “Power Module and Power Device” Evaluation Services)

Hello everyone.
I’m Nakamatsu from the Power Device Design Section.

In my last blog, I explained how short-circuit tests are conducted, and this time, I would like to mention avalanche capability tests of power MOSFETs also as one of destructive tests.
(Click here for our “Power Module and Power Device” Evaluation Services)

Hello everyone, nice to meet you.
I’m Nakamatsu from the Power Device Design Section.

I am mainly involved in the evaluation of power devices (discrete power MOSFETs and IGBTs and their modules).

In this article, I would like to talk about short circuit tests of power devices.
(Click here for our “Power Module and Power Device” Evaluation Services)